摘要: |
瓷介电容器通过减薄介质膜层厚度可以实现小型化、大容量。针对减薄后能否满足宇航应用可靠性要求,我们开展了试验研究与验证,探索了宇航用瓷介电容器介质厚度确定的理论和试验依据,研究分析了目前材料、制造和控制水平与宇航标准要求的差异,对比了不同介质厚度产品性能和可靠性的差异,试验验证了介质厚度与产品性能及可靠性的理论模型。 |
关键词: 宇航用瓷介电容器;介质膜厚;可靠性设计;试验验证 |
基金项目: |
|
Experimental Study on Influences of Layer Thickness on Reliability of Ceramic Dielectric Capacitors for Space Application |
Liu Fupin1, Liu Fupin2, Sun Shuying2
|
1. China Aerospace Standard Institute;2. Beijing Yuanliuhongyuan Electronic Co. Ltd.
|
Abstract: |
The miniaturization and large capacity of the ceramic dielectric capacitor can be realized by decreasing the dielectric layer thickness. It remains unknown whether the modified capacitor can fulfill the reliability requirements of space application. In order to answer this question, the related experimental study and verification work are carried out, to explore the theoretical and experimental basis, analyze the discrepance between the requirements from aerospace standards and the current materials, manufacturing and controlling level, and compare the distinction in performance and reliability of varied dielectric layer thickness. From this sense, the study has verified the theoretical model that explains the relationships between the dielectric layer thickness and the performance and reliability of ceramic dielectric capacitors. |
Key words: ceramic dielectric capacitor for space application;dielectric layer thickness;reliability design;experimental verification |